PHYS 3450 – Spring
2005
The exam will cover the material in chapters 2, 3 and 4 of the textbook. You will be allowed to bring one 3” ´ 5” card with anything you want on it for use during the exam. Physical constants will be provided with the exam. The list of topics below is intended to guide your studying for the exam.
The wave equation and its solutions
Notation for harmonic waves
Mathematical forms of waves
Interpretation of the various symbols (e.g., k, v, l, n, t, k, w)
Superposition principle
Plane and spherical waves
Electromagnetic waves
Relationships
between E, B and k (directions, magnitudes, phases)
Poynting vector and irradiance
Photons
Momentum of EM waves and photons
Optical cooling
Radiation
Synchrotron radiation
Dipole radiation
Scattering and absorption in matter
Dispersion and dipole moments (permanent and induced)
Index of refraction
Chap. 4
Scattering
Rayleigh scattering
Wavelength dependence
Color of sky and sunsets
Reflection
Phase shifts at an interface
Law of reflection
Plane of incidence
Refraction
Snell’s Law
Fresnel equations (supplied if needed)
Two cases
Perpendicular to plane of incidence
Parallel to plane of incidence
Interpretation of r and t
Interpretation of R and T
Polarization
Total internal reflection
PHYS 3450 – Spring
2005
The exam will cover the material in chapters 5 and 6 of the textbook. You will be allowed to bring one 3” ´ 5” card with anything you want on it for use during the exam. Physical constants will be provided with the exam. The list of topics below is intended to guide your studying for the exam.
Terms to know and be able to explain:
Paraxial approximation
Focal point and focal length
Real and virtual images
Meridonial rays
Transverse magnification
Angular magnification
Refraction at a spherical surface
Focusing power of this surface
Thin lenses
Use of Lensmaker’s Formula
Use of Gaussian lens formula
Sign conventions for so, si, R, f, etc.
Determination of location, type and size of image
Ray tracing for single and multiple lens systems
Aperture and field stops
f -numbers
Planar mirrors
Location and size of images
Spherical mirrors
Use of mirror formula
Sign conventions for so, si, R, f, etc.
Determination of location, type and size of image
Ray tracing for mirrors and combinations of mirrors and lenses
Prisms
Dispersing
Fiberoptics
Physics of how it works
Cladding
Intermodal dispersion
What is it , what are its effects, and how is it “fixed”?
Optical systems (basic features of each)
The eye
Correction of myopia and hyperopia
Simple magnifier
Microscope
Telescope
Matrix optics
Terms and ideas
Ray vector
Transfer matrix
Refraction matrix
System matrix
Application to thick and thin lenses
Aberrations
Spherical
Chromatic
PHYS 3450 – Spring
2005
The exam will cover the material in chapters 7 and 8 of the textbook. You will be allowed to bring one 3” ´ 5” card with anything you want on it for use during the exam. Physical constants will be provided with the exam. The list of topics below is intended to guide your studying for the exam. You should know the meanings of the various terms as well as being able to work problems on the topics.
Superposition of waves of the same frequency
Phase difference
Optical path difference
Constructive/destructive interference
Standing waves (basic ideas and description)
Superposition of waves of different frequency
Beats and beat frequency
Group velocity
Anharmonic waves
Fourier’s theorem
Frequency spectrum
Fourier series expansions
Nonperiodic waves
Description of process of synthesizing
Fourier integrals
Pulses and wave packets
Frequency bandwidth
Coherence length
Nature/description of polarized light
Relative phases, amplitudes and math descriptions
Linear
Circular
Elliptical
Law of Malus and its use
Polarizers
Wire-grid
Polaroid film
Birefringence
Basic description and effects
Polarization by scattering
Polarization by reflection
Brewster’s law
Description by dipole radiation
Fresnel equations
Retarders
Principle and application to:
Full-wave plate
Half-wave plate
Quarter-wave plate
Production of circularly polarized light
Optical activity
d-rotatory and l-rotatory
Specific rotatory power
Optical modulators
Photoelasticity
Faraday effect
Kerr and Pockels cells
Liquid crystals
Description of material
Applications
Final Exam Review
The final exam will be given on Mon., May 2, at 8:00 am in Rogers 109. The exam will be comprehensive, but it will be more heavily weighted towards material covered since the third class exam; i.e., material from the covered parts of chapters 9, 10 and 13 will be included more extensively than the material in chapters 2-8. You may bring to the exam one 3” ´ 5” card with anything you want written on that card. Physical constants will be provided as needed on the exam.
Below is a list of topics for which explanations and problem solving may be required. Terms that you may be asked to explain are in italics:
Interference of waves from two sources
General case
Conditions for maxima and minima
Dielectric films (don’t just remember equations; explanations may be needed as well)
Conditions for constructive and destructive interference
Phase shifts
General layout
Effects that cause fringe shifts
Multiple-beam interference
Phasor addition of amplitudes
Fabry-Perot interferometer
Several coherent oscillators
Relative phase shifts
Coherent line source
Obliquity (and its relationship to the Huygens-Fresnel principle)
Conditions for Fraunhofer diffraction
Single-slit diffraction
Technique for its solution
Description and use of the solution
Double-slit diffraction
How solution is obtained
Interpretation in terms of single-slit diffraction and double-slit interference
Many-slit diffraction
Description of results
Rectangular and circular apertures
Description of results
Resolution
Resolving power
Conditions for Fresnel diffraction
Meaning
Sum of amplitudes
Fresnel integrals and the rectangular aperture
Description of technique
Chap. 13
Lasers
Optical resonant cavity
Holography
Difference from ordinary photograph
Methods
In-line hologram
Side-band Fresnel hologram
(Comprehensive Section)
Notation for harmonic waves
Mathematical forms of waves
Interpretation of the various symbols (e.g., k, v, l, n, t, k, w)
Its relation to the wave equation
Refraction
Snell’s Law
Fresnel equations (supplied if needed)
Two cases
Perpendicular to plane of incidence
Parallel to plane of incidence
Interpretation of r and t
Terms to know and be able to explain:
Transverse magnification
Angular magnification
Thin lenses
Use of the lens formula
Sign conventions for so, si, R, f
Determination of location, type and size of image
Ray tracing for single and multiple lens systems
Spherical mirrors
Use of mirror formula
Sign conventions for so, si, R, f, etc.
Determination of location, type and size of image
Ray tracing for mirrors and combinations of mirrors and lenses
Superposition of waves of the same frequency
Phase difference
Superposition of waves of different frequency
Beats and beat frequency
Dispersion and group velocity
Nature/description of polarized light
Relative phases, amplitudes and math descriptions
Linear
Circular
Elliptical
Law of Malus and its use
Polarization by scattering and by reflection
Brewster’s law
Description by dipole radiation
Fresnel equations
Fourier References
http://www.nst.ing.tu-bs.de/schaukasten/fourier/en_idx.html
http://www.phy.ntnu.edu.tw/java/sound/sound.html
http://www.jhu.edu/~signals/fourier2/